{"id":305,"date":"2014-02-19T11:15:46","date_gmt":"2014-02-19T11:15:46","guid":{"rendered":"http:\/\/old.dimes.unical.it\/nexuslab\/?page_id=305"},"modified":"2017-04-12T18:25:40","modified_gmt":"2017-04-12T16:25:40","slug":"journal-articles","status":"publish","type":"page","link":"https:\/\/labs.dimes.unical.it\/nexuslab\/publications\/journal-articles\/","title":{"rendered":"Journal Articles"},"content":{"rendered":"<ul>\n<li>Pace C. , Nanodevices and Nanomaterials for Ecological Security. NATO Science for Peace and Security Series B: Physics and Biophysics Shunin Y.N.,Kiv A.E. Cap. 21, &#8221; Electronic noise in deeply scaled nanodevices&#8221;, : Spinger-Verlag. 2012. pp. 225-235.<\/li>\n<li>Magnelli L. , Crupi F. , Corsonello P. , Pace C. , Iannaccone G. , &#8221; A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference&#8221;. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2011, Vol. 46, n. 2, pp. 1-10.<\/li>\n<li>Giusi G. , Crupi F. , Ciofi C. , Pace C. , Magnone P. , &#8221; Instrumentation Design for Cross-Correlation Measurements between Gate and Drain Low Frequency Noise in MOSFETs&#8221;. Fluctuation and Noise Letters, 2010, pp. 313-322.<\/li>\n<li>Chabukswar S. , Maji D. , Manoj C. , Anil K. G. , Rao V. R. , Crupi F. , Magnone P. , Giusi G. , Pace C. , Collaert N. , &#8221; Implications of Fin Width Scaling on Variability and Reliability of High-k Metal Gate FinFETs&#8221;. Microelectronic engineering, 2010, pp. 1963-1967.<\/li>\n<li>Perrelli M. , Nudo P. , Donnici M. , Gatti G. , Colacino F. M. , Pace C. , Danieli G. , &#8221; Navi-Robot, a multipurpose robot for medical applications&#8221;. PROBLEMSOF MECHANICS, 2010, Vol. 41, n. 4, pp. 22-33.<\/li>\n<li>Magnone P. , Crupi F. , Giusi G. , Pace C. , Simoen E. , Claeys C. , Pantisano L. , Maji D. , Rao V. R. , Srinivasan P. , &#8221; 1\/f noise in drain and gate current of MOSFETs with high-k gate stacks&#8221;. IEEE Transactions on device and materials reliability, 2009, Vol. 9, n. 2, pp. 180-189.<\/li>\n<li>Maji D. , Crupi F. , Amat E. , Simoen E. , De Jaeger B. , Brunco D. , Manoj C. , Rao V. R. , Magnone P. , Giusi G. , Pace C. , Pantisano L. , Mitard J. , Rodr\u00edguez R. , Nafr\u00eda M. , &#8221; Understanding and Optimization of Hot Carrier Reliability in Germanium-on-Silicon pMOSFETs&#8221;. IEEE Transactions on electron devices, 2009, Vol. 56, n. 5, pp. 1063-1069.<\/li>\n<li>Giusi G. , Crupi F. , Pace C. , Magnone P. , &#8221; Full Model and Characterization of Noise in Operational Amplifier&#8221;. IEEE TRANSACTION ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS, 2009, Vol. 56, n. 1, pp. 97-102.<\/li>\n<li>Crupi F. , Giusi G. , Iannaccone G. , Magnone P. , Pace C. , Simoen E. , Claeys C. , &#8221; Analytical model for the 1\/f noise in the tunneling current through metal-oxide-semiconductor structures&#8221;. Journal of Applied Physics, 2009, Vol. 106, pp. 073710-1-073710-6.<\/li>\n<li>Khalaf W. , Pace C. , Gaudioso M. , &#8221; Least Square Regression Method for Estimating Gas&#8221;. SENSORS, 2009, Vol. 9, n. 3, pp. 1678-1691.<\/li>\n<li>Magnone P. , Mercha A. , Subramanian V. , Parvais B. , Collaert N. , Dehan M. , Decoutere S. , Groeseneken G. , Benson J. , Merelle T. , Lander R. , Crupi F. , Pace C. , &#8221; Matching Performance of FinFET Devices With Fin Widths Down to 10 nm&#8221;. IEEE Electron Device Letters, 2009, Vol. 30, n. 12, pp. 1374-1376.<\/li>\n<li>Giusi G. , Pace C. , Crupi F. , &#8221; Cross-correlation-based trans-impedance amplifier for current noise measurements&#8221;. International Journal of Circuit Theory and Applications, 2009, Vol. 37, pp. 781-792.<\/li>\n<li>Magnone P. , Pantisano L. , Crupi F. , Trojman L. , Pace C. , Giusi G. , &#8221; On the impact of defects close to the gate electrode on the low-frequency 1\/f noise&#8221;. IEEE Electron Device Letters, 2008, Vol. 29, pp. 1056-1058.<\/li>\n<li>Magnone P. , Subramanian V. , Parvais B. , Mercha A. , Pace C. , Dehan M. , Decoutere S. , Groeseneken G. , Crupi F. , Pierro S. , &#8221; Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices&#8221;. Microelectronic engineering, 2008, Vol. 85, n. 8, pp. 1728-1731.<\/li>\n<li>Giusi G. , Crupi F. , Pace C. , &#8221; Ultrasensitive low noise voltage amplifier for spectral analysis&#8221;. Review of Scientific Instruments, 2008, Vol. 79, n. 8, pp. x-x.<\/li>\n<li>Khalaf W. , Pace C. , Gaudioso M. , &#8221; Gas Detection via Machine Learning&#8221;. International Journal of Intelligent Technology, 2008, Vol. 3, n. 1, pp. 43-47.<\/li>\n<li>Giusi G. , Crupi F. , Pace C. , &#8221; An algorithm for separating multi-level random telegraph signal from 1\/f noise&#8221;. Review of Scientific Instruments, 2008, Vol. 79, n. 2, pp. 024701-x.<\/li>\n<li>Pace C. , Giusi G. , Crupi F. , Lombardo S. , &#8221; Detection and classification of single-electron jumps in Si nanocrystal memories&#8221;. IEEE Transactions on Instrumentation and Measurement, 2008, Vol. 57, n. 2, pp. 364-368.<\/li>\n<li>Maji D. , Crupi F. , Giusi G. , Pace C. , Simoen E. , Claeys C. , Rao V. R. , &#8221; On the dc and noise properties of gate current in epi-Ge pMOSFETs with TiN\/TaN\/HfO2\/SiO2 gate stack&#8221;. Applied physics letters, 2008, Vol. 92, pp. 163508-1-163508-3.<\/li>\n<li>Ciofi C. , Crupi F. , Pace C. , Scandurra G. , Patan\u00e8 M. , &#8221; A New Circuit Topology for the Realization of Very Low Noise, Wide Bandwidth Transimpedance Amplifier&#8221;. IEEE Transactions on Instrumentation and Measurement, 2007, pp. 1626-1631.<\/li>\n<li>Corso D. , Pace C. , Crupi F. , Lombardo S. , &#8221; Single electron program\/erase tunnel events in nanocrystal memories&#8221;. IEEE Transactions on Nanotechnology, 2007, Vol. 6, n. 1, pp. 35-42.<\/li>\n<li>Magnone P. , Crupi F. , Pantisano L. , Pace C. , &#8221; Fermi-level pinning at polysilicon-HfO2 interface as a source of drain and gate current 1\/f noise&#8221;. Applied physics letters, 2007, Vol. 90, pp. 073507-1-073507-4.<\/li>\n<li>Pace C. , Crupi F. , Corso D. , Lombardo S. , &#8221; Experimental study of single-electron phenomena in silicon nanocrystal memories&#8221;. Journal of Nanoscience and Nanotechnology, 2007, Vol. 7, n. 1, pp. 322-328.<\/li>\n<li>Magnone P. , Pace C. , Crupi F. , Giusi G. , &#8221; Low frequency noise in nMOSFETs with subnanometer EOT Hafnium-based gate dielectrics&#8221;. Microelectronics Reliability, 2007, pp. 2109-2113.<\/li>\n<li>Srinivasan P. , Crupi F. , Simoen E. , Magnone P. , Pace C. , Misra D. , Claeys C. , &#8221; Interfacial layer quality effects on low-frequency noise (1\/f) in p-MOSFETs with advanced gate stacks&#8221;. Microelectronics Reliability, 2007, Vol. 47, pp. 501-504.<\/li>\n<li>Ciofi C. , Crupi F. , Pace C. , Scandurra G. , &#8221; How to Enlarge the Bandwidth without Increasing the Noise in Op-Amp based Transimpedance Amplifier&#8221;. IEEE Transactions on Instrumentation and Measurement, 2006, Vol. 55, n. 3, pp. 814-819.<\/li>\n<li>Crupi F. , Srinivasan P. , Magnone P. , Simoen E. , Pace C. , Misra D. , Claeys C. , &#8221; Impact of the interfacial layer on low-frequency noise (1\/f) behavior of MOSFETs with advanced gate stacks&#8221;. IEEE Electron Device Letters, 2006, Vol. 27, n. 8, pp. 688-692.<\/li>\n<li>Giusi G. , Crupi F. , Ciofi C. , Pace C. , &#8221; Three-channel amplifier for high-sensitivity voltage noise measurements&#8221;. Review of Scientific Instruments, 2006, Vol. 77, pp. 095104-1-095104-5.<\/li>\n<li>Giusi G. , Crupi F. , Ciofi C. , Pace C. , &#8221; Ultra sensitive method for current noise measurements&#8221;. Review of Scientific Instruments, 2006, pp. 015107-1-015107-5.<\/li>\n<li>Crupi F. , Giusi G. , Ciofi C. , Pace C. , &#8221; Enhanced sensitivity cross-correlation method for voltage noise measurements&#8221;. IEEE Transactions on Instrumentation and Measurement, 2006, Vol. 55, n. 4, pp. 1143-1147.<\/li>\n<li>Giusi G. , Crupi F. , Pace C. , Ciofi C. , Groeseneken G. , &#8221; Comparative Study of Drain and Gate Low Frequency Noise in nMOSFETs with Hafnium Based Gate Dielectrics&#8221;. IEEE Transactions on electron devices, 2006, Vol. 53, n. 4, pp. 823-828.<\/li>\n<li>Pace C. , Crupi F. , Lombardo S. , Gerardi C. , Cocorullo G. , &#8221; Room-temperature single-electron effects in Si nanocrystal memories&#8221;. Applied physics letters, 2005, Vol. 87, pp. 1-3.<\/li>\n<li>Crupi F. , Pace C. , Cocorullo G. , Groeseneken G. , Aoulaiche M. , Houssa M. , &#8221; Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics&#8221;. Microelectronic engineering, 2005, pp. 130-133.<\/li>\n<li>Ciofi C. , Crupi F. , Pace C. , Scandurra G. , &#8221; Micro-Prober for Wafer-Level Low-Noise Measurements in MOS Devices&#8221;. IEEE Transactions on Instrumentation and Measurement, 2003, Vol. 52, n. 5, pp. 1533-1536.<\/li>\n<li>Pace C. , Crupi F. , Ciofi C. , &#8221; Very low noise, high accuracy, programmable voltage reference&#8221;. IEEE Transactions on Instrumentation and Measurement, 2003, Vol. 52, n. 4, pp. 1251-1254.<\/li>\n<li>Ciofi C. , Crupi F. , Pace C. , &#8221; A New Method for High Sensitivity Noise Measurements&#8221;. IEEE Transactions on Instrumentation and Measurement, 2002, Vol. 51, n. 4, pp. 656-659.<\/li>\n<li>Scandurra G. , Ciofi C. , Pace C. , Speroni F. , Alagi F. , &#8221; True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines&#8221;. Microelectronics Reliability, 2002, Vol. 42, n. 9-11, pp. 1347-1351.<\/li>\n<li>Crupi F. , Iannaccone G. , Ciofi C. , Neri B. , Lombardo S. , Pace C. , &#8221; Low frequency current noise in unstressed\/stressed thin oxide metal-oxide-semiconductor capacitors&#8221;. Solid State Electronics, 2002, Vol. 46, n. 11, pp. 1807-1813.<\/li>\n<li>Neri G. , Bonavita A. , Galvagno S. , Pace C. , Patane&#8217; S. , Arena A. , &#8221; Preparation, characterization and CO sensing of Au\/iron oxide thin films&#8221;. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2002, Vol. 13, n. 9, pp. 561-565.<\/li>\n<li>Pace C. , Neri G. , Rizzo G. , Arena A. , Patane&#8217; S. , Visco A. M. , Galvagno S. , &#8221; Solid-state dye-laser materials by sol-gel synthesis of SiO2 composites&#8221;. , 2001, Vol. 12, pp. 427-433.<\/li>\n<li>Crupi F. , Ciofi C. , Pace C. , Iannaccone G. , Neri B. , &#8221; Noise as a probe of the charge transport mechanisms through thin oxides in MOS structures&#8221;. Fluctuation and Noise Letters, 2001, Vol. 1, n. 2, pp. 61-64.<\/li>\n<li>Neri G. , Bonavita A. , Galvagno S. , Pace C. , Patane&#8217; S. , Arena A. , &#8221; Humidity sensing properties of Li-iron oxide based thin films&#8221;. SENSORS AND ACTUATORS B-CHEMICAL, 2001, Vol. 73, n. 2-3, pp. 89-94.<\/li>\n<li>Pace C. , Allegrini M. , Arena A. , Girlanda R. , Patane&#8217; S. , Saitta G. , &#8221; Synthesis and optical characterization of stable and highly luminescent poly-(9-vinylcarbazole)-aluminum-tris-(8-hydroxyquinoline) blends&#8221;. JOURNAL OF MATERIALS RESEARCH, 1999, Vol. 14, n. 6, pp. 2640-2643.<\/li>\n<li>Allegrini M. , Arena A. , Labardi M. , Martino G. , Girlanda R. , Pace C. , Patane&#8217; S. , Saitta G. , Savasta S. , &#8221; Photoluminescence from a soluble semiconducting polymer in waveguide and microcavity configurations&#8221;. Applied Surface Science, 1999, Vol. 142, n. 1-4, pp. 603-607.<\/li>\n<li>Pace C. , &#8221; Dispositivi in film sottile a gradiente di riflettivit\u00e0 : teoria e metodologie di progetto&#8221;. In Lezioni della scuola nazionale di Optoelettronica &#8220;A. Cingolani&#8221; &#8211; SORGENTI LASER A STATO SOLIDO E TECNOLOGIE ASSOCIATE, Roma: CNR, 1994, pp. 100-109.<\/li>\n<li>Pace C. , Nava E. , Cali&#8217; C. , &#8221; A simple GRM design for tunable Ti:Sapphire laser&#8221;. Pure and Applied Optics, 1994, Vol. 3, pp. 441-447.<\/li>\n<li>Arnone C. , Giaconia C. , Pace C. , Greco M. , &#8221; Flexible Laser Tracing Systems for Defining Thin Film Hybryd Geometry&#8221;. Hybrid Circuits, 1994, Vol. 33, pp. 14-18.<\/li>\n<li>Giaconia C. , Pace C. , &#8221; Microlithographic patterning in dielectric multilayer&#8221;. Vuoto : scienza e tecnologia, 1994, Vol. 23, n. 2, pp. 14-18.<\/li>\n<li>Arnone C. , Giaconia C. , Pace C. , Bonura S. , Greco M. , &#8221; Laser beam lithography for 3-D surface patterning&#8221;. In Atti della scuola &#8220;Laser Applications for Mechanical Industry (a cura di), Dordrecht (The Netherlands): Kluwer Academic Publishers, 1993, pp. 315-319.<\/li>\n<li>Perrone M. R. , Cali&#8217; C. , Pace C. , &#8221; Performance of a XeCl laser with super-gaussian reflectivity unstable resonators&#8221;. Optics Communications, 1992, Vol. 92, n. 1-3, pp. 93-98.<\/li>\n<li>Cali&#8217; C. , Mezzolla F. , Pace C. , Perrone M. R. , Rejfir P. , &#8221; Characterization of an unstable gaussian-reflectivity resonator in a XeCl laser&#8221;. Optics Communications, 1991, Vol. 81, n. 5, pp. 301-305.<\/li>\n<li>Cali&#8217; C. , Pace C. , &#8221; Impiego e tecnologia costruttiva degli specchi a gradiente di riflettivit&#8221;. Informazione Elettronica, 1991, Vol. 4, pp. 31-33.<\/li>\n<li>Perrone M. R. , Mezzolla F. , Cali&#8217; C. , Pace C. , &#8221; Super-Gaussian Reflectivity Unstable Resonator for Excimer Lasers&#8221;. Applied physics letters, 1991, Vol. 59, n. 10, pp. 1153-1155.<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Pace C. , Nanodevices and Nanomaterials for Ecological Security. NATO Science for Peace and Security Series B: Physics and Biophysics Shunin Y.N.,Kiv A.E. Cap. 21, &#8221; Electronic noise in deeply scaled nanodevices&#8221;, : Spinger-Verlag. 2012. pp. 225-235. Magnelli L. , Crupi F. , Corsonello P. , Pace C. , Iannaccone G. , &#8221; A 2.6 [&hellip;]<\/p>\n","protected":false},"author":9,"featured_media":221,"parent":17,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-305","page","type-page","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/pages\/305","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/comments?post=305"}],"version-history":[{"count":1,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/pages\/305\/revisions"}],"predecessor-version":[{"id":498,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/pages\/305\/revisions\/498"}],"up":[{"embeddable":true,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/pages\/17"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/"}],"wp:attachment":[{"href":"https:\/\/labs.dimes.unical.it\/nexuslab\/wp-json\/wp\/v2\/media?parent=305"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}