Journal Articles

• Pace C. , Nanodevices and Nanomaterials for Ecological Security. NATO Science for Peace and Security Series B: Physics and Biophysics Shunin Y.N.,Kiv A.E. Cap. 21, ” Electronic noise in deeply scaled nanodevices”, : Spinger-Verlag. 2012. pp. 225-235.
• Magnelli L. , Crupi F. , Corsonello P. , Pace C. , Iannaccone G. , ” A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference”. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2011, Vol. 46, n. 2, pp. 1-10.
• Giusi G. , Crupi F. , Ciofi C. , Pace C. , Magnone P. , ” Instrumentation Design for Cross-Correlation Measurements between Gate and Drain Low Frequency Noise in MOSFETs”. Fluctuation and Noise Letters, 2010, pp. 313-322.
• Chabukswar S. , Maji D. , Manoj C. , Anil K. G. , Rao V. R. , Crupi F. , Magnone P. , Giusi G. , Pace C. , Collaert N. , ” Implications of Fin Width Scaling on Variability and Reliability of High-k Metal Gate FinFETs”. Microelectronic engineering, 2010, pp. 1963-1967.
• Perrelli M. , Nudo P. , Donnici M. , Gatti G. , Colacino F. M. , Pace C. , Danieli G. , ” Navi-Robot, a multipurpose robot for medical applications”. PROBLEMSOF MECHANICS, 2010, Vol. 41, n. 4, pp. 22-33.
• Magnone P. , Crupi F. , Giusi G. , Pace C. , Simoen E. , Claeys C. , Pantisano L. , Maji D. , Rao V. R. , Srinivasan P. , ” 1/f noise in drain and gate current of MOSFETs with high-k gate stacks”. IEEE Transactions on device and materials reliability, 2009, Vol. 9, n. 2, pp. 180-189.
• Maji D. , Crupi F. , Amat E. , Simoen E. , De Jaeger B. , Brunco D. , Manoj C. , Rao V. R. , Magnone P. , Giusi G. , Pace C. , Pantisano L. , Mitard J. , Rodríguez R. , Nafría M. , ” Understanding and Optimization of Hot Carrier Reliability in Germanium-on-Silicon pMOSFETs”. IEEE Transactions on electron devices, 2009, Vol. 56, n. 5, pp. 1063-1069.
• Giusi G. , Crupi F. , Pace C. , Magnone P. , ” Full Model and Characterization of Noise in Operational Amplifier”. IEEE TRANSACTION ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS, 2009, Vol. 56, n. 1, pp. 97-102.
• Crupi F. , Giusi G. , Iannaccone G. , Magnone P. , Pace C. , Simoen E. , Claeys C. , ” Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures”. Journal of Applied Physics, 2009, Vol. 106, pp. 073710-1-073710-6.
• Khalaf W. , Pace C. , Gaudioso M. , ” Least Square Regression Method for Estimating Gas”. SENSORS, 2009, Vol. 9, n. 3, pp. 1678-1691.
• Magnone P. , Mercha A. , Subramanian V. , Parvais B. , Collaert N. , Dehan M. , Decoutere S. , Groeseneken G. , Benson J. , Merelle T. , Lander R. , Crupi F. , Pace C. , ” Matching Performance of FinFET Devices With Fin Widths Down to 10 nm”. IEEE Electron Device Letters, 2009, Vol. 30, n. 12, pp. 1374-1376.
• Giusi G. , Pace C. , Crupi F. , ” Cross-correlation-based trans-impedance amplifier for current noise measurements”. International Journal of Circuit Theory and Applications, 2009, Vol. 37, pp. 781-792.
• Magnone P. , Pantisano L. , Crupi F. , Trojman L. , Pace C. , Giusi G. , ” On the impact of defects close to the gate electrode on the low-frequency 1/f noise”. IEEE Electron Device Letters, 2008, Vol. 29, pp. 1056-1058.
• Magnone P. , Subramanian V. , Parvais B. , Mercha A. , Pace C. , Dehan M. , Decoutere S. , Groeseneken G. , Crupi F. , Pierro S. , ” Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices”. Microelectronic engineering, 2008, Vol. 85, n. 8, pp. 1728-1731.
• Giusi G. , Crupi F. , Pace C. , ” Ultrasensitive low noise voltage amplifier for spectral analysis”. Review of Scientific Instruments, 2008, Vol. 79, n. 8, pp. x-x.
• Khalaf W. , Pace C. , Gaudioso M. , ” Gas Detection via Machine Learning”. International Journal of Intelligent Technology, 2008, Vol. 3, n. 1, pp. 43-47.
• Giusi G. , Crupi F. , Pace C. , ” An algorithm for separating multi-level random telegraph signal from 1/f noise”. Review of Scientific Instruments, 2008, Vol. 79, n. 2, pp. 024701-x.
• Pace C. , Giusi G. , Crupi F. , Lombardo S. , ” Detection and classification of single-electron jumps in Si nanocrystal memories”. IEEE Transactions on Instrumentation and Measurement, 2008, Vol. 57, n. 2, pp. 364-368.
• Maji D. , Crupi F. , Giusi G. , Pace C. , Simoen E. , Claeys C. , Rao V. R. , ” On the dc and noise properties of gate current in epi-Ge pMOSFETs with TiN/TaN/HfO2/SiO2 gate stack”. Applied physics letters, 2008, Vol. 92, pp. 163508-1-163508-3.
• Ciofi C. , Crupi F. , Pace C. , Scandurra G. , Patanè M. , ” A New Circuit Topology for the Realization of Very Low Noise, Wide Bandwidth Transimpedance Amplifier”. IEEE Transactions on Instrumentation and Measurement, 2007, pp. 1626-1631.
• Corso D. , Pace C. , Crupi F. , Lombardo S. , ” Single electron program/erase tunnel events in nanocrystal memories”. IEEE Transactions on Nanotechnology, 2007, Vol. 6, n. 1, pp. 35-42.
• Magnone P. , Crupi F. , Pantisano L. , Pace C. , ” Fermi-level pinning at polysilicon-HfO2 interface as a source of drain and gate current 1/f noise”. Applied physics letters, 2007, Vol. 90, pp. 073507-1-073507-4.
• Pace C. , Crupi F. , Corso D. , Lombardo S. , ” Experimental study of single-electron phenomena in silicon nanocrystal memories”. Journal of Nanoscience and Nanotechnology, 2007, Vol. 7, n. 1, pp. 322-328.
• Magnone P. , Pace C. , Crupi F. , Giusi G. , ” Low frequency noise in nMOSFETs with subnanometer EOT Hafnium-based gate dielectrics”. Microelectronics Reliability, 2007, pp. 2109-2113.
• Srinivasan P. , Crupi F. , Simoen E. , Magnone P. , Pace C. , Misra D. , Claeys C. , ” Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks”. Microelectronics Reliability, 2007, Vol. 47, pp. 501-504.
• Ciofi C. , Crupi F. , Pace C. , Scandurra G. , ” How to Enlarge the Bandwidth without Increasing the Noise in Op-Amp based Transimpedance Amplifier”. IEEE Transactions on Instrumentation and Measurement, 2006, Vol. 55, n. 3, pp. 814-819.
• Crupi F. , Srinivasan P. , Magnone P. , Simoen E. , Pace C. , Misra D. , Claeys C. , ” Impact of the interfacial layer on low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks”. IEEE Electron Device Letters, 2006, Vol. 27, n. 8, pp. 688-692.
• Giusi G. , Crupi F. , Ciofi C. , Pace C. , ” Three-channel amplifier for high-sensitivity voltage noise measurements”. Review of Scientific Instruments, 2006, Vol. 77, pp. 095104-1-095104-5.
• Giusi G. , Crupi F. , Ciofi C. , Pace C. , ” Ultra sensitive method for current noise measurements”. Review of Scientific Instruments, 2006, pp. 015107-1-015107-5.
• Crupi F. , Giusi G. , Ciofi C. , Pace C. , ” Enhanced sensitivity cross-correlation method for voltage noise measurements”. IEEE Transactions on Instrumentation and Measurement, 2006, Vol. 55, n. 4, pp. 1143-1147.
• Giusi G. , Crupi F. , Pace C. , Ciofi C. , Groeseneken G. , ” Comparative Study of Drain and Gate Low Frequency Noise in nMOSFETs with Hafnium Based Gate Dielectrics”. IEEE Transactions on electron devices, 2006, Vol. 53, n. 4, pp. 823-828.
• Pace C. , Crupi F. , Lombardo S. , Gerardi C. , Cocorullo G. , ” Room-temperature single-electron effects in Si nanocrystal memories”. Applied physics letters, 2005, Vol. 87, pp. 1-3.
• Crupi F. , Pace C. , Cocorullo G. , Groeseneken G. , Aoulaiche M. , Houssa M. , ” Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics”. Microelectronic engineering, 2005, pp. 130-133.
• Ciofi C. , Crupi F. , Pace C. , Scandurra G. , ” Micro-Prober for Wafer-Level Low-Noise Measurements in MOS Devices”. IEEE Transactions on Instrumentation and Measurement, 2003, Vol. 52, n. 5, pp. 1533-1536.
• Pace C. , Crupi F. , Ciofi C. , ” Very low noise, high accuracy, programmable voltage reference”. IEEE Transactions on Instrumentation and Measurement, 2003, Vol. 52, n. 4, pp. 1251-1254.
• Ciofi C. , Crupi F. , Pace C. , ” A New Method for High Sensitivity Noise Measurements”. IEEE Transactions on Instrumentation and Measurement, 2002, Vol. 51, n. 4, pp. 656-659.
• Scandurra G. , Ciofi C. , Pace C. , Speroni F. , Alagi F. , ” True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines”. Microelectronics Reliability, 2002, Vol. 42, n. 9-11, pp. 1347-1351.
• Crupi F. , Iannaccone G. , Ciofi C. , Neri B. , Lombardo S. , Pace C. , ” Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitors”. Solid State Electronics, 2002, Vol. 46, n. 11, pp. 1807-1813.
• Neri G. , Bonavita A. , Galvagno S. , Pace C. , Patane’ S. , Arena A. , ” Preparation, characterization and CO sensing of Au/iron oxide thin films”. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2002, Vol. 13, n. 9, pp. 561-565.
• Pace C. , Neri G. , Rizzo G. , Arena A. , Patane’ S. , Visco A. M. , Galvagno S. , ” Solid-state dye-laser materials by sol-gel synthesis of SiO2 composites”. , 2001, Vol. 12, pp. 427-433.
• Crupi F. , Ciofi C. , Pace C. , Iannaccone G. , Neri B. , ” Noise as a probe of the charge transport mechanisms through thin oxides in MOS structures”. Fluctuation and Noise Letters, 2001, Vol. 1, n. 2, pp. 61-64.
• Neri G. , Bonavita A. , Galvagno S. , Pace C. , Patane’ S. , Arena A. , ” Humidity sensing properties of Li-iron oxide based thin films”. SENSORS AND ACTUATORS B-CHEMICAL, 2001, Vol. 73, n. 2-3, pp. 89-94.
• Pace C. , Allegrini M. , Arena A. , Girlanda R. , Patane’ S. , Saitta G. , ” Synthesis and optical characterization of stable and highly luminescent poly-(9-vinylcarbazole)-aluminum-tris-(8-hydroxyquinoline) blends”. JOURNAL OF MATERIALS RESEARCH, 1999, Vol. 14, n. 6, pp. 2640-2643.
• Allegrini M. , Arena A. , Labardi M. , Martino G. , Girlanda R. , Pace C. , Patane’ S. , Saitta G. , Savasta S. , ” Photoluminescence from a soluble semiconducting polymer in waveguide and microcavity configurations”. Applied Surface Science, 1999, Vol. 142, n. 1-4, pp. 603-607.
• Pace C. , ” Dispositivi in film sottile a gradiente di riflettività : teoria e metodologie di progetto”. In Lezioni della scuola nazionale di Optoelettronica “A. Cingolani” – SORGENTI LASER A STATO SOLIDO E TECNOLOGIE ASSOCIATE, Roma: CNR, 1994, pp. 100-109.
• Pace C. , Nava E. , Cali’ C. , ” A simple GRM design for tunable Ti:Sapphire laser”. Pure and Applied Optics, 1994, Vol. 3, pp. 441-447.
• Arnone C. , Giaconia C. , Pace C. , Greco M. , ” Flexible Laser Tracing Systems for Defining Thin Film Hybryd Geometry”. Hybrid Circuits, 1994, Vol. 33, pp. 14-18.
• Giaconia C. , Pace C. , ” Microlithographic patterning in dielectric multilayer”. Vuoto : scienza e tecnologia, 1994, Vol. 23, n. 2, pp. 14-18.
• Arnone C. , Giaconia C. , Pace C. , Bonura S. , Greco M. , ” Laser beam lithography for 3-D surface patterning”. In Atti della scuola “Laser Applications for Mechanical Industry (a cura di), Dordrecht (The Netherlands): Kluwer Academic Publishers, 1993, pp. 315-319.
• Perrone M. R. , Cali’ C. , Pace C. , ” Performance of a XeCl laser with super-gaussian reflectivity unstable resonators”. Optics Communications, 1992, Vol. 92, n. 1-3, pp. 93-98.
• Cali’ C. , Mezzolla F. , Pace C. , Perrone M. R. , Rejfir P. , ” Characterization of an unstable gaussian-reflectivity resonator in a XeCl laser”. Optics Communications, 1991, Vol. 81, n. 5, pp. 301-305.
• Cali’ C. , Pace C. , ” Impiego e tecnologia costruttiva degli specchi a gradiente di riflettivit”. Informazione Elettronica, 1991, Vol. 4, pp. 31-33.
• Perrone M. R. , Mezzolla F. , Cali’ C. , Pace C. , ” Super-Gaussian Reflectivity Unstable Resonator for Excimer Lasers”. Applied physics letters, 1991, Vol. 59, n. 10, pp. 1153-1155.